Fischer Technology

As the electronics industry makes use of thinner coatings, manufacturers increase their demands for technologies to accurately and reliably measure complex surface finishes/functional coatings. X-ray fluorescence (XRF) instruments are the method of choice to meet these demands. Fischer’s XRF instruments enable simultaneous thickness and composition measurement of every surface finish such as IAg, ISn, ENIG and ENEPIG. Fischer’s leading Spectrometer and Software technologies allow for the measurement of the Phosphorous content in Electroless Nickel even under ENEPIG Gold and Palladium layers.