Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWS

Tear on a microchip contacts, this can be seen only under the microscope.

We study components, systems and materials of electronics, microsystems technology and nanotechnologies, such as semiconductor integrated circuits, sensors, electronic components and assemblies as well as nanostructured functional materials. These are comprehensively analyzed and tested in order to understand in detail the relationship between functional behavior, microstructure and material properties. A focal point of our work is, among other things, the fast and customer-oriented elucidation of causes of defects and defect formation by means of comprehensive and ultra-high-resolution diagnostics. The results are incorporated into the customer’s manufacturing processes and contribute to increasing the quality and reliability of the systems in the application.

We offer:

Material diagnostics of components, components and materials of electronics, microsystems technology and nanotechnology
Complex physical fault analysis, numerical simulation and lifetime prediction
Development of diagnostic, test, test and modeling methods as well as related tools