KITEC microelectronic technologie GmbH

Metrology for semiconductor display and thin-film technology
We offer solutions for applications

for layer thickness measurement
for surface topography, including 3D measurement
for contactless resistance measurement.

The systems are available for the different wafer diameters up to 300mm, also for the automatic measurement process.

Wrapping Systems
Wafer Sorter
Wafer ID
Wafer Tools
Vacuum Tweezers
Microscope Loader

Wafer handling

We offer solutions for manual as well as automatic wafer handling. Our offer covers the following product groups:
Umhordesysteme
Wafer sorter
Wafer ID reading systems
Wafer Tools
vacuum tweezers
microscope Loader