About ORSAY PHYSICS With nearly 30 years of experience and leadership in the charged optic’s particles field, and more particularly in Focused Ions Beams (FIB) columns and Scanning Electron Microscope (SEM) as well as associated equipments such as Gas Injection Systems (GIS), Secondary Electron Detectors (SED), ORSAY PHYSICS allows you to: – Reach a wide panel of equipments to analyze Read more...
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